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Electron Nano-imaging: Basics Of Imaging and Diffraction for TEM and STEM

Tanaka, Nobuo

Electron Nano-imaging: Basics Of Imaging and Diffraction for TEM and STEM - 1st. - Japan Springer 2017 - xxviii; 333p.

ISBN: 9784431565000

Subjects--Topical Terms: --Physics, Nano-imaging

Dewey Class. No.: 530 / TAN

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