VLSI Test Principles and Architectures (Record no. 113381)

MARC details
000 -LEADER
fixed length control field 00388nam a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 240416s9999||||xx |||||||||||||| ||und||
020 ## - ISBN
Price RS 625.00
International Standard Book Number 9789380501550
040 ## - CATALOGING SOURCE
Original cataloging agency School of Electronics Engineering Library
082 ## - DDC NUMBER
Classification number 621.395 WAN,LT
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Wang,LT
245 #0 - TITLE STATEMENT
Title VLSI Test Principles and Architectures
250 ## - EDITION STATEMENT
Edition statement 1st
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc New Delhi
Name of publisher, distributor, etc Elsevier
Date of publication, distribution, etc 2011
300 ## - PHYSICAL DESCRIPTION
Pages Xxx,777p
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Location (home branch) Sublocation or collection (holding branch) Date acquired Koha issues (times borrowed) Koha full call number Accession No. Koha date last seen Koha item type Non-public note Public note Cost, normal purchase price Source of acquisition
        School of Electronics Engineering Library School of Electronics Engineering Library 07.10.2011   621.395 WAN,LT KSEE47894 16.04.2024 Books BSR/12117 30/08/2011 625.00 UBSPD
        School of Electronics Engineering Library School of Electronics Engineering Library 07.10.2011   621.395 WAN,LT KSEE54934 16.04.2024 Books BSR/12117 30/08/2011 625.00 UBSPD
        School of Electronics Engineering Library School of Electronics Engineering Library 07.10.2011   621.395 WAN,LT KSEE54935 16.04.2024 Books BSR/12117 30/08/2011 625.00 UBSPD

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