Image from Amazon.com
Built in Test for VLSI:Pseudorandom Techniques
Material type:
TextPublication details: New York John Wiley and Sons 1987Description: xiii,354PISBN: - 9780471624639
| Item type | Current library | Home library | Call number | Status | Notes | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
Reference
|
School of Electronics Engineering Library | School of Electronics Engineering Library | Available | 29/03/2012 | KSEE54136 | |||
|
Reference
|
School of Electronics Engineering Library | School of Electronics Engineering Library | Available | 29/03/2012 | KSEE54135 |
There are no comments on this title.
Log in to your account to post a comment.