Test Generation Of Crosstalk Delay Faults In Vlsi Circuits

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TextPublication details: Springer Singapore 2019Edition: 1stDescription: xi,156pISBN:

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Holdings
Item type	Current library	Home library	Call number	Status	Notes	Date due	Barcode
Books	Central Library	Central Library	621.395 JAY (Browse shelf(Opens below))	Available	23/06/2022		CLIB122920

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Previous	621.395 GAY Op-Amps and Linear Integrated Circuits	621.395 GAY Op-Amps and Linear Integrated Circuits	621.395 GAZ Field-Programmable Gate Array Technologies For High Performance Instrumentation	621.395 JAY Test Generation Of Crosstalk Delay Faults In Vlsi Circuits	621.395 KAN CMOS Digital Integrated Circuits	621.395 KUM Multiple Constant Multiplication Optimizations for Field Programmable Gate Arrays	621.395 MAN Digital Logic & Computer Design	Next

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