Wang,LT <br/><br/>
VLSI Test Principles and Architectures 

 - 1st 
 - New Delhi  Elsevier  2011 
 - Xxx,777p 
<br/><br/><label>ISBN: </label>9789380501550  RS 625.00 
<br/><br/><label>Dewey Class. No.: </label>621.395 WAN,LT