Xie,Hui <br/><br/>
Atomic Force Microscopy Based Nanorobotics 

 - New York  Springer  2011 
 - xiv,342p. 
<br/><br/><label>ISBN: </label> RS 10555.25 
<br/><br/><label>Dewey Class. No.: </label>629.892 XIE.H