Reliability Wear-out Mechanics in Advanced CMOS Technologies

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Material type: Text

TextPublication details: New Jersey John Wiley & Sons 2009Description: xv,624pISBN:

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Holdings
Item type	Current library	Home library	Call number	Status	Notes	Date due	Barcode
Books	Central Library	Central Library	621.3 ALV (Browse shelf(Opens below))	Available	29/09/2016		CLIB107318

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