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1.
Built in Test for VLSI:Pseudorandum Techniques by
Material type: Text Text
Publication details: New York John Wiley and Sons 1987
Availability: Items available for loan: School of Electronics Engineering Library (2).

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2.
Built in Test for VLSI:Pseudorandom Techniques by
Material type: Text Text
Publication details: New York John Wiley and Sons 1987
Availability: Items available for loan: School of Electronics Engineering Library (2).

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